Test Time versus Design-for-Test Resources in Mixed Signal Systems
نویسندگان
چکیده
Functional macro testing of analog subsystems is providing a reasonable approach to testing in mixed signal systems. This allows the partitioning of the analog from digital components. Two approaches emerge: analog test bus and Built-In-Self-Test (BIST). Design-for-Test (DFT) issues arise in both approaches which include additional circuitry for control and observation. This additional circuit cost is balanced against test scheduling since the cost of testing can be directly related to test time. This paper explores some of the DFT issues regulating the balance of circuitry versus concurrent test using a new cost model.
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